Surface Science Characterization Laboratory
The Chemical Engineering Department has over 1000 square feet of laboratory space dedicated to materials characterization research in the College of Engineering and
is utilized by researchers in the SSIM program.
Materials characterization equipment available include:
One of the Raman systems and the x-ray diffractometer is located in WSU's Central Instrumentation Facilities, while the micro-Raman spectrometer is located in the Wayne State Institute for Manufacturing Research's materials research facilities. All other equipment comprises dedicated systems located in the SSIM and Chemical Engineering laboratories.
- Integrated UHV analysis system (equipped with STM and AFM, AES/LEED, a quadrupole mass spectrometer, temperature program desorption, ion sputtering, vapordeposition,
and a low pressure reactor)
- High pressure reactor system coupled with a gas chromatograph
- FTIR equipped with diffuse reflectance accessories for control atmosphere studies
- X-ray diffractometer
- Thermal gravimetric analyzer coupled with a quadrupole mass spectrometer, a differential scanning calorimeter, and a thermomechanical analyzer.
The UHV-compatible STM, AFM, and LEED/Auger are from Omicron Associates. The STM and AFM have additional vibration isolation of the microscope stage via a four-spring suspension system with magnetic damping. These microscopes are designed with a two-dimensional (X and Z) sample approach stage, which utilizes inertia drive shear piezos, thus eliminating the need for any external mechanical links to the microscope. This ensures that the microscope is fully decoupled during sample approach and imaging. The whole UHV-STM system is very stable and a vertical resolution of 0.1 Å and a lateral resolution of 1 Å can be achieved quite easily. The control unit is interfaced with an HP-9000 workstation for data acquisition.
Spectral resolution can be as high as 0.25 cm-1. The x-ray diffractometer is a Rigaku 12 kW rotating anode system, equipped with a PSD from Innovative Technology. The thermal gravimetric analyzer, differential scanning calorimeter, and thermomechanical analyzer are Perkin Elmer 7-series, equipped with a PE-7700 data station capable of multitasking. The FTIR spectrometer is a Nicolet 20 DXC with a MCT detector, and the gas chromatograph is an HP 5890A dual-column gas chromatography equipped with flame ionization and thermal conductivity detectors.