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SSIM Basic Materials Analysis Laboratory
Surface Topology and Chemical/Elemental Surface Analysis Equipment
- Perkin-Elmer 5500 X-ray photoelectron spectrometer for surface chemical/elemental analysis, with an Ar ion sputtering gun for depth profiling
- Perkin-Elmer 660 Auger spectrometer, with a scanning electron microprobe for imaging and elemental mapping
- AFM/STM
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